The SpikeSafe 60A DC Current Source supports LED reliability, burn-in test, IESNA LM-80 and other applications. It provides reliable and accurate current drive at compliance voltages up to 50V. This capability makes the SS400 DC 60A an ideal choice to power series circuits containing multiple high current devices.
Each source channel delivers up to 3000W of output power at an industry-leading 96% power conversion efficiency. High efficiency reduces electricity and cooling needs, lowering the total cost of ownership for systems incorporating the SS400.
Multiple output conductor pairs keep maximum current per conductor below 7.5A, allowing the current output to be routed through standard interconnect devices.
Built-in voltage and current readback circuits support LM-80 monitoring requirements. Devices being tested are protected with a gentle turn-on during ramp-up, and with SpikeSafe™ load protection during operation.
60A Current Source Key Specifications
- Independent Programmable Source Channels: 1
- Output Power: 3000W/Channel, 3000W Total
- Max. Compliance Voltage: 50V
- Max. Current: 60A
- Output Current Accuracy: 0.2%+8mA
- Recommended Min. Operating Current: 285mA
System Configuration Options
SpikeSafe DC Current Sources are available in a self-contained 2U rack-mountable chassis that holds one module, or in multi-module rack systems that house up to 8, 24 or 32 modules. Scalable, modular design enables easy system expansion for increased capacity or specialized test performance.
Vektrex DC Current Source System Configuration Options
Additional Features and Software
SpikeSafe Current Sources run on economical bulk DC power. Consult Vektrex to select the appropriate bulk power supply for your application.
SpikeSafe load protection continuously monitors voltage and current patterns and instantly shuts down drive when device anomalies are detected.
Optional SpikeSafe Test and Reliability Software (STARS) controls and monitors 1 to 32 SpikeSafe modules. STARS supports source setup, data logging, error monitoring, test timing, and power cycling.
