UV measurements for LEDs and lasers that are based on standard methodologies are critical to the success of the industry. Consistent measurement methods ensure that manufacturers’ devices actually deliver the advertised power, and the methods ensure measurements agree between labs. In addition to delivering consistent measurements, published methods provide improved measurements that overcome thermal, optical and electrical challenges new UV parts present. By understanding both the available and evolving knowledge base and practical applications of both methods, the industry can increase its growth in these markets.
📰 NIST, IUVA, and Vektrex Collaboration Produces LM-92 UV LED Testing Standard: Jeff Hulett, Cameron Miller, and Troy Cowan detail the importance of cross-organization participation in UV standards development and how those efforts will further market penetration and performance of GUV devices.
📰 Simplify Short Pulse Test Implementation: Published in LEDs Magazine, Jeff Hulett explains how a new short-pulse test method has advanced spectrometer and source/measure instrument capabilities used in electro-optical measurements of LEDs.
📰 Short Pulses For Better Measurements: This article, authored by Jeff Hulett, explains why short pulses will achieve more accurate optical measurements.
✎ LM-80-21 Release Improves Testing Methodology: LM-80-21 improves testing methodology for visible LED devices and addresses applicability to new classes of devices, including UV LEDs, laser diodes and filament LEDs
📰 Mean Differential Continuous Pulse Method for Accurate Optical Measurements of Light-Emitting Diodes and Laser Diodes: NIST publication related to methods for accurate optical measurements of LEDs and Laser Diodes.
📰 Practical Implementation and Applications of DCP Measurements: The new Differential Continuous Pulse (DCP) measurement method is a powerful tool that can speed and simplify challenging LED and laser optical measurements.
✎ Use Fast Precise Pulsed SMU to Characterize LED Droop: LED products are typically characterized using methods that increase device heating. These outdated methods, using DC current, long pulses or staircase sweeps result in temperature droop.