Solutions from Vektrex address specific application needs for LED and Laser manufacturers within our areas of expertise including LM-80, LM-85, Light Measurement applications, Reliability for LEDs and Lasers, Burn-In, load boards and custom burn-in fixtures and accessories. Our system solutions include LM-80 systems for LEDs, COB, LED modules, Automated Light Measurement Systems, Light Measurement Systems integrated with Instrument Systems CAS Spectrometers and others, Reliability and Burn-in Systems for LEDs, VCSEL, and Lasers and more. Vektrex has a full team of engineers to support your system needs including software and fixturing. Please contact Vektrex to discuss your needs.
LED Reliability
Vektrex is the leading supplier of LED reliability and burn-in test systems. Vektrex systems populate facilities world-wide supporting reliability test of LEDs and other semiconductor devices.
Light
Light Measurement is required to meet LM-80 standards testing. During LM-80 test, periodic photometric measurements are taken. Resultant data is entered a TM-21 specified algorithm and a Lumen Maintenance (LM) number is calculated.
LM-80 Drive Electronics
Drive/power electronics for LM-80 testing form the foundation for successful testing. Selecting the best drive electronics is a very important decision.
LM-80 Test Solutions
Vektrex offers complete LM-80 test solutions that meet all IESNA and Energy Star testing criteria. Vektrex actively participates on the LM-80 committee, chairing the LM-80 working group moving this standard through the acceptance process and into IEEE acceptance.
LM-80 Thermal Control
Vektrex LM-80 thermal control systems (ITCS chambers) utilize water-based, closed-loop active control to provide efficient and uniform thermal control for semiconductor devices.
Thermal Measurements
Thermal measurements are used in a variety of applications involving LEDs, laser diodes and other semiconductor devices. Specifically junction temperature, is useful at all stages of semiconductor production from design and development to quality assurance. The basis for every semiconductor data sheet and end user design is junction temperature.
