By C. Cameron Miller, NIST, Yuqin Zong, NIST, and Jeff Hulett, Vektrex

Vektrex CTO Jeff Hulett and NIST scientists Cameron Miller and Yuqin Zong co-authored an article on new optical metrology standards for UV devices. The article discusses the importance of documentary standards in the modern economy, particularly at inflection points, such as the introduction of new technology (e.g. UV-C LEDs). It then outlines the new UV measurement standards that have recently been published. Several new standards that are planned are outlined and explained. Finally, the three speculate on the possibility of additional application-specific standards for specific UV markets.

Read full UV Solutions Magazine article.

About Jeff Hulett

Jeff Hulett is the Founder and CTO of Vektrex Electronic Systems, Inc. Because of his vision and leadership, the company grew from a start-up to the market leader. Currently, Hulett is the Chief Architect for Vektrex products placing the highest emphasis on technology and quality. Hulett holds a BSEE from the Illinois Institute of Electronics, and has been awarded four U.S.patents. He is a member of the Illumination Engineering Society of North America (IESNA), and chairs the IESNA LM-80 working group that is focused on LED flux maintenance testing. He has been active in the LED testing and reliability field since 2004.