Jeff Hulett, Founder and CTO

Jeff Hulett is the Founder and CTO of Vektrex Electronic Systems, Inc. Because of his vision and leadership, the company grew from a start-up to the market leader. Currently, Hulett is the Chief Architect for Vektrex products placing the highest emphasis on technology and quality. Hulett holds a BSEE from the Illinois Institute of Electronics, and has been awarded four U.S.patents. He is a member of the Illumination Engineering Society of North America (IESNA), and chairs the IESNA LM-80 working group that is focused on LED flux maintenance testing. He has been active in the LED testing and reliability field since 2004. Some important research is found on this page.

Based on Hulett’s vision, VEKTREX has grown into a company with a legacy of innovation and excellence based upon a philosophy of CNEI – or constant never-ending improvement. Research and development activities are conducted from a foundation of ethics, honesty and enthusiasm. VEKTREX employees are encouraged to foster innovation while maintaining work-life balance.

Of the innovations spearheaded by Hulett, the SpikeSafe precision pulsed source measure unit (SMU) was announced in 2019. The SpikeSafe SMU sources pulsed current with submicrosecond to low microsecond rise/fall times, programmable load tuning, fast pulses, on the fly pulse width correction and time-aligned voltage measurements. As a result, the SpikeSafe SMU results in less heating during testing and greater measurement stability. The SpikeSafe SMU meets ongoing needs for more efficient and accurate LED and laser testing and measurements. Since its launch, the SpikeSafe SMU has won the esteemed SSL Enabling Technologies and test award at LEDs Magazine Sapphire Awards.

Some important research is found on this page. You may also visit the info page for additional research activity.

✎ Learn more about Junction Temperature Assessment for LEDs & Lasers Operated in Pulsed Mode as presented at CORM

πŸ“° Short Pulse Testing Eliminates Self-Heating Errors To Produce True LI Graphs: As published in LED Professional, the article authored by Jeff Hulett, Vektrex, and Dr. Markus Schneider, OSRAM, explains in detail the basic problems that may be resolved with short pulse testing.

πŸ“° New Optical Metrology and Documentary Standards for GUV Radiation Sources: In May 2020, the Illuminating Engineering Society (IES) and International Ultraviolet Association (IUVA) signed a memorandum of understanding to assemble a group of experts in the measurement of ultraviolet C-band (UVC) emissions to develop American National Standards (ANSI Standards) for the measurement and characterization of UVC device performance.

πŸ“° NIST, IUVA, and Vektrex Collaboration Produces LM-92 UV LED Testing Standard: Jeff Hulett, Cameron Miller, and Troy Cowan detail the importance of cross-organization participation in UV standards development and how those efforts will further market penetration and performance of GUV devices.

πŸ“° Simplify Short Pulse Test Implementation: Published in LEDs Magazine, Jeff Hulett explains how a new short-pulse test method has advanced spectrometer and source/measure instrument capabilities used in electro-optical measurements of LEDs.

πŸ“° Short Pulses For Better Measurements: This article, authored by Jeff Hulett, explains why short pulses will achieve more accurate optical measurements. 

✎ LM-80-21 Release Improves Testing Methodology: LM-80-21 improves testing methodology for visible LED devices and addresses applicability to new classes of devices, including UV LEDs, laser diodes and filament LEDs.

πŸ“° Mean Differential Continuous Pulse Method for Accurate Optical Measurements of Light-Emitting Diodes and Laser Diodes: NIST Journal of Research Introducing MDCP and DCP measurement methods for UV-LEDs. LM-92 is an LM85 measurement method and documents the MDCP/DCP methods. These methods produce the most accurate light measurements and are applicable to all devices where light is measured in pulsed mode. Note the DCP method is required for UV-LED light measurements.

πŸ“° Factors to Consider with UV Measurements: UV-LEDs require special methods to accurately measure light. This LEDs Magazine webinar presents the new measurement methods for UV-LEDs as described in IESNA LM-92.

πŸ“° Practical Implementation and Applications of DCP Measurements: The new Differential Continuous Pulse (DCP) measurement method is a powerful tool that can speed and simplify challenging LED and laser optical measurements. 

✎ Use Fast Precise Pulsed SMU to Characterize LED Droop: LED products are typically characterized using methods that increase device heating. These outdated methods, using DC current, long pulses or staircase sweeps result in temperature droop.

✎ Amber LED Light Research: Vektrex amber LED light research project identified and confirmed a light measurement anomaly.  The Instrument Systems CAS-140D, in conjunction with Vektrex pulsed SMU, has allowed us to confirm an amber LED measurement anomaly that was discovered during this research in 2019. 

✎ I-V Curve Tracing for Transistors: IV curve tracing for transistors can best be accomplished using Vektrex precision source measure units. The application is a semiconductor device test and the device is a transistor.

✎ Use Fast Precise Pulsed SMU to Improve High-Power IV Characterization: Devices such as lasers and LEDs are characterized by plotting the forward current vs voltage for the device’s typical operating range – for example from 10% of maximum current to maximum current. The output data is used as input to marketing for development of datasheets.

✎ Application Note: Laser Diode Power Supply Transient Response Under Typical Laser Diode Fault Conditions: Semiconductor laser diodes are often tested under stress conditions. When a laser fails, it can suffer catastrophic damage if the power supply does not have a failsafe to shut down power to devices in the event of a failure.

πŸ“° The Industry Needs Better LED Measurements: Three hundred years ago global navigation was a dangerous undertaking. Ships sailing east and west had to determine their longitude by a tedious method known as dead reckoning. Errors were commonplace and calculations were typically off by a few percent at the end of a long voyage – often enough to make landing in port or on a rocky reef equally likely.

πŸ“° Is Your Light Measurement Method Undervaluing Your LEDs?: The LED industry is facing a roadblock that threatens its continued rapid evolution. Heating effects are making it nearly impossible to accurately measure the performance of new LEDs. 

▢️ Video: Three Steps to Improved LED Light Measurements: Repeatability: This segment of our webinar series discusses which factors must be controlled for optimal repeatability and gives examples of what to look for and what to avoid in your measurement equipment.

▢️ Video: Three Steps to Improved LED Light Measurements: Accuracy: Once you have the capability to use all three measurement methods, the question becomes: which method will yield the most accurate measurements? Vektrex engineers conducted an L-I sweep with the Osram LY W5SM-GZJX-46-0-400-R18-Z Yellow LED using each of the three methods. 

▢️ Video: Three Steps to Improved LED Light Measurements: Power: The three steps to improved LED light measurements begin with power. Jeff Hulett, Vektrex CTO, teaches how to identify current source power limitations that may negatively impact your LED light measurements.

✎ Measuring LED Junction Temperature (Tj): In this technical article, Jeff Hulett dives into the details of measuring junction temperature (Tj). He covers relevant standards, equipment, equations and more.

πŸ“° Improved Photometric Testing for High-Power LEDs: Photometric testing standards first appeared in the late 1800’s; they were needed by the emerging gas lighting industry. 

✎ LM-85 Light Measurements for High Power LEDs: LM-85 is an Illuminating Engineering Society (IES) approved method for the Electrical and Photometric Measurements of High Power LEDs. 

A Comparison of LM-85 LED Measurement Methods from 2019. Things have changed!!