Short-Pulse Testing Eliminates Self-Heating Errors to Produce True L-I Graphs

Since the rise of LEDs as the preferred light source, accurate determination of their parameters has become crucial. One of these parameters – and a standard measure – is measuring LED light output versus current (L-I). Unfortunately, the result is not independent of other parameters. The environment, the package type and many other factors may distort the result.  An article authored by Jeff Hulett, Vektrex, and Dr. Markus Schneider, OSRAM, explains in detail the basic problems that may be resolved with short pulse testing.  

Access LpR 83 on the LED Professional to read the article.  

Contact Vektrex for more information about short pulse testing using the SpikeSafe SMU.

Jeff Hulett

Jeff Hulett is the Founder and CTO of Vektrex Electronic Systems, Inc. Because of his vision and leadership, the company grew from a start-up to the market leader. Currently, Hulett is the Chief Architect for Vektrex products placing the highest emphasis on technology and quality. Hulett holds a BSEE from the Illinois Institute of Electronics, and has been awarded four U.S.patents. He is a member of the Illumination Engineering Society of North America (IESNA), and chairs the IESNA LM-80 working group that is focused on LED flux maintenance testing. He has been active in the LED testing and reliability field since 2004.

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