Vektrex Featured on LEDInside
Feb 08, 2018
LEDinside published the news about demos we are showing at Strategies in Light 2018. Bring your own device to the show and test it using Vektrex equipment!Read more >
Why You Should Stop Averaging Your Measurements
Jan 31, 2018
Watch the video to learn how you can stop averaging measurements and start saving both time and money with one simple change to your testing setup.Read more >
Vektrex Visits Texas Instruments HQ – Catching a Glimpse into the History of Integrated Circuits
Sep 28, 2017
On a visit to the Texas Instruments Headquarters in Dallas, TX, Vektrex CTO Jeff Hulett stopped to appreciate the Nobel Prize Medal of Jack S. Kilby, whose work as an electrical engineer at Texas Instruments in the mid-twentieth century earned him his commemoration as a Nobel Laureate.Read more >
Paving the Way for High Power LEDs – The Story of Lumileds’ Reliability Lab Manager, Hung Nguyen
Jul 31, 2017
Read about Hung Nguyen's journey as a manager at Lumileds and get his take on the direction of the LED industry.Read more >
Modern LED Industry Faces Old-World Challenge of Measurement Error
May 17, 2017
Jeff Hulett’s most recent article begins by recounting a three-hundred-year-old tale of maritime navigation hampered by compounding errors in longitude calculation and ends with the shockingly similar issue in the LED industry.Read more >
The Industry Needs Better LED Measurements
May 17, 2017
Hulett presents the old-world problem that plagues today's LED measurements. Learn what it is, why it matters, and what you can do about it.Read more >
Is Your Light Measurement Method Undervaluing Your LEDs?
May 17, 2017
The LED industry is facing a roadblock that threatens its continued rapid evolution. Learn how to dodge it by reading this technical article.Read more >
Vektrex CTO Tackles Roadblock that Threatens Advancement of LED Industry
Mar 16, 2017
In Jeff Hulett’s latest article, published in Pennwell’s LEDs Magazine, he identifies the source of wide-spread measurement errors in the LED industry, details measurement methods that can help reduce these errors, and provides guidelines to ensure that LEDs are not undervalued.Read more >
LM-85 Research – Light Measurement Error Sources
May 04, 2016
Typical LED measurement systems use source/measure instruments delivering DC or pulsed current. In many of these systems junction temperature is uncontrolled, resulting in LED transient junction heating. This combined with timing variability can introduce flux measurement variability –especially at high power levels. This paper presents LM-85 research results conducted at Vektrex that traces the source...Read more >
