Articles

The History of LM-85-23

Events

ANSI/IES LM-85-23 for LED Product Design

Events

Use Junction Temperature Measurement to Improve UV-LED Lifetime Projections and Reduce Cost

Measurement Repeatability

The History of LM85

Light Measurement

A High-Accuracy UV-LED Characterization System

LM-92

UV-LED Measurement Station

LM-92

Two Important Papers Presented at IUVA 2024 Conference

LM-92

New Optical Metrology and Documentary Standards for GUV Radiation Sources

Junction Temperature (Tj)

Junction Temperature Assessment for LEDs & Lasers Operated in Pulsed Mode Presentation at CORM 2022

Source Measure Unit

MA-tek Announces VCSEL Test Services

News

NIST, IUVA, and Vektrex Collaboration Produces LM-92 UV LED Testing Standard

Source Measure Unit

Simplify Short Pulse Test Implementation