New Optical Metrology and Documentary Standards for GUV Radiation Sources
By C. Cameron Miller, NIST, Yuqin Zong, NIST, and Jeff Hulett, Vektrex Vektrex CTO Jeff Hulett and NIST scientists Cameron…
News and Articles
Junction Temperature Assessment for LEDs & Lasers Operated in Pulsed Mode Presentation at CORM 2022
Monday November 14, 2022 Vektrex CTO Jeff Hulett chairs the CORM “LED applications and Metrology” session. The session details are…
MA-tek Announces VCSEL Test Services
MA-tek announced their VCSEL test service. The test system is based upon a Vektrex SMU that provides short pulses. For…
NIST, IUVA, and Vektrex Collaboration Produces LM-92 UV LED Testing Standard
Jeff Hulett, Cameron Miller, and Troy Cowan detail the importance of cross-organization participation in UV standards development and how those…
Simplify Short Pulse Test Implementation
Published in LEDs Magazine, Jeff Hulett explains how a new short-pulse test method has advanced spectrometer and source/measure instrument capabilities…
LM-85 Light Measurements for High Power LEDs
LM-85 is an Illuminating Engineering Society (IES) approved method for the Electrical and Photometric Measurements of High Power LEDs. The…
Short Pulses For Better Measurements
LED electrical and optical parameters are traditionally measured using test current pulses that last 20ms. Until recently, this approach has…
Log Scaling Now Available With Spikesafe SMU
Easily Generate Structure Functions and Determine Thermal Resistance Capabilities previously only available in an expensive, single-purpose instrument are now available…
Accurate Optical Measurements of Light Emitting Diodes and Laser Diodes
Accurate Optical Measurements of Light Emitting Diodes and Laser Diodes using the powerful Differential Continuous Pulse measurement method. The powerful…