Use Vektrex Fast Pulsed SMU to Beat the Heat
Vektrex SMU used to evaluate effectiveness of industry test methods. Device junction heating distorts measurements, causing L-I curves to droop…
News and Articles
Instrument Systems Announces Short Pulse Testing Capability
Reliable short-pulse measurements require pulsed current sources with fast rise and fall times in conjunction with spectroradiometers having measuring times…
Short-Pulse Testing Eliminates Self-Heating Errors to Produce True L-I Graphs
Since the rise of LEDs as the preferred light source, accurate determination of their parameters has become crucial. One of…
Current Source Induced LED Photometric Measurement Variations Presentation at CORM
Jeff Hulett, Vektrex CTO, discussed Current Source Induced LED Photometric Measurement Variations at CORM...
Happy Holidays from Vektrex
Our friends in China have introduced us to a symbol (危机) that indicates challenge and opportunity. This symbol we equate…
UV LED Thyristor Effect
The SpikeSafe SMU was used to resolve a question regarding UV LED testing that was vexing the IES working group:…
LM-80 LED Based Standards Applied to UV Devices
UV device market success requires end users to select one device over others. Key to this selection is reliable and…
Use Sub-50µs Pulses to Characterize LED Droop
Using sub-50µs pulses, LED droop may be characterized. LED products are typically characterized using methods that increase device heating. These…
Precision Source Measure Unit manufacturer Vektrex announces release of the Spikesafe High Current Source Measure Unit
20A Precision Source Measure Unit The addition of a 20A precision source measure unit to our product portfolio allows Vektrex…