News and Articles
Page 2 of 8
Use Vektrex Fast Pulsed SMU to Beat the Heat
Vektrex SMU used to evaluate effectiveness of industry test methods. Device junction heating distorts measurements, causing L-I curves to droop…
Instrument Systems Announces Short Pulse Testing Capability
Short-Pulse Testing Eliminates Self-Heating Errors to Produce True L-I Graphs
Current Source Induced LED Photometric Measurement Variations Presentation at CORM
Jeff Hulett, Vektrex CTO, discussed Current Source Induced LED Photometric Measurement Variations at CORM...