Vektrex CTO Jeff Hulett presents LM-85 research (measurement repeatability) comparing the three LM-85 test methods (constant current, single pulse, continuous pulse) with a focus on phosphor devices. Mr. Hulett will identify and quantify other error sources and propose guidelines for other methods.
Test what you previously didn’t have the power to see – with remarkable repeatability SpikeSafe SMU is a precision pulsed…
Devices such as lasers and LEDs are characterized by plotting the forward current vs voltage for the device’s typical operating…
The Illuminating Engineering Society of North America (IESNA) Testing Procedures Committee (TPC) conducted its semiannual meeting in Ft. Lauderdale from…
In this video, we discuss how you can optimize the equipment in your lab to improve measurement repeatability and reduce time to market for your devices.
To achieve accurate test data, LEDs, laser diodes, and other devices must be tested at their max capacity for the required amount of time. Watch this video to learn how to avoid equipment with hidden limitations.
Vektrex products will be shown in the Rapitech booth during this show. Stop by to see demonstrations of the Performance Series with SpecWin Pro software.
Application Note: Laser Diode Power Supply Transient Response Under Typical Laser Diode Fault Conditions
When a laser fails, it can suffer catastrophic damage if the power supply does not have a failsafe. This application note documents tests conducted with three different types of power supplies to determine how they respond to a typical failure scenario.
Video: Compare Powering 25W COB with Vektrex Performance Series Current Source and Keithley Source Meter
Don’t compromise. Use a current source that can provide the power you need to test your device. You’re selling your devices for full power operation so you should be able to test them at full power. Watch the video to learn why.