LM-80-21 Release Improves Testing Methodology
LM-80-21 improves testing methodology for visible LED devices and addresses applicability to new classes of devices, including UV LEDs, laser…
News and Articles
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“Factors to Consider with UV LED Measurements” LEDs Magazine Webinar November 18, 2021
UV and UV-C LEDs exhibit a transient voltage effect that increases Vf during the first few milliseconds of operation. While…
“Practical Implementation and Applications of DCP Measurements” to be presented at CORM November 16, 2021.
The new Differential Continuous Pulse (DCP) measurement method is a powerful tool that speeds and simplifies challenging LED and laser…
Use SpikeSafe 400 Pulsed Source to Power and Test LED modules to 400V
The SpikeSafe 400 pulsed source is ideal for powering and testing LED modules with series circuits up to 400V. Test…
Use Vektrex Fast Pulsed SMU to Beat the Heat
Vektrex SMU used to evaluate effectiveness of industry test methods. Device junction heating distorts measurements, causing L-I curves to droop…
Instrument Systems Announces Short Pulse Testing Capability
Reliable short-pulse measurements require pulsed current sources with fast rise and fall times in conjunction with spectroradiometers having measuring times…
Short-Pulse Testing Eliminates Self-Heating Errors to Produce True L-I Graphs
Since the rise of LEDs as the preferred light source, accurate determination of their parameters has become crucial. One of…
Current Source Induced LED Photometric Measurement Variations Presentation at CORM
Jeff Hulett, Vektrex CTO, discussed Current Source Induced LED Photometric Measurement Variations at CORM...