Accurate Optical Measurements of Light Emitting Diodes and Laser Diodes using the powerful Differential Continuous Pulse measurement method.
The powerful Differential Continuous Pulse (DCP) measurement method and an improved Mean-DCP method are formally presented to the scientific and metrology community in a paper written by Jeff Hulett along with Cameron Miller, and Yuqin Zong of NIST. Additional co-authors include Nomasa Koide and Yoshiki Yamaji, of Nichia Corporation. Yamaji and Koide originated the DCP method, which remained secret for many years, before it was disclosed during a September, 2020 CIE standards meeting. This paper appears in volume 126 of NIST’s Journal of Research: https://www.nist.gov/nist-research-library/journal-research-nist
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