The new Differential Continuous Pulse (DCP) measurement method is a powerful tool that can speed and simplify challenging LED and laser optical measurements. This presentation first presents an example DCP measurement system architecture, highlighting the key system components and their impact on measurement speed and accuracy. Then the results of several difficult real-world measurement examples are discussed, including: 1) high-power device testing in small spheres, 2) quantum efficiency measurement at high current density, 3) UV-C LED measurement, 4) constant junction temperature I-V curve creation, and 5) short-pulse testing for VCSEL and laser-based illumination components. Each example provides actual DCP measurement results for the LED or laser device. Comparison measurement data, created using traditional long-pulse measurement methods, is also presented, and the corresponding DCP accuracy improvement is calculated. The talk concludes with specific recommendations for designing/upgrading light measurement systems to take advantage of DCP’s superior measurement performance.
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