The new Differential Continuous Pulse (DCP) measurement method is a powerful tool that speeds and simplifies challenging LED and laser optical measurements. This presentation presents an example DCP measurement system architecture, Key system components and their impact on measurement speed and accuracy are highlighted. The results of several difficult real-world measurement examples are discussed, including: 1) high-power device testing in small spheres, 2) quantum efficiency measurement at high current density, 3) UV-C LED measurement, 4) constant junction temperature I-V curve creation, and 5) short-pulse testing for VCSEL and laser-based illumination components. Each example provides actual DCP measurement results for the LED or laser device. Comparison measurement data, created using traditional long-pulse measurement methods, is also presented, and the corresponding DCP accuracy improvement is calculated. The talk concludes with specific recommendations for designing/upgrading light measurement systems to take advantage of DCP’s superior measurement performance. 

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About Jeff Hulett

Jeff Hulett is the Founder and CTO of Vektrex Electronic Systems, Inc. Because of his vision and leadership, the company grew from a start-up to the market leader. Currently, Hulett is the Chief Architect for Vektrex products placing the highest emphasis on technology and quality. Hulett holds a BSEE from the Illinois Institute of Electronics, and has been awarded four U.S.patents. He is a member of the Illumination Engineering Society of North America (IESNA), and chairs the IESNA LM-80 working group that is focused on LED flux maintenance testing. He has been active in the LED testing and reliability field since 2004.