《差分连续脉冲DCP 测量法的实际应用》讲演将于 2021 年 11 月 16 日在 CORM 上展示。

新的差分连续脉冲 (DCP) 测量方法是一种强大的工具,可以加速和简化具有挑战性的 LED 和激光光学测量。本讲演首先展示了一个 DCP 测量系统架构示例,重点介绍了关键系统组件及其对测量速度和精度的影响。然后讨论了几个目前普遍认为难以量测的结果,包括:1) 小球体中的高功率元件的测试,2) 高电流密度下的量子效率测量,3) UV-C LED 测量,4) 恒定结温IV 曲线创建,以及 5) VCSEL 和基于激光的照明组件的短脉冲测试。每个示例都提供 LED 或激光设备的实际 DCP 测量结果。作为比较,还提供了使用传统长脉冲测量方法创建的测量数据,并计算了相应的 DCP 精度改进。讲演最后提出了关于设计/升级光测量系统以利用 DCP 卓越测量性能的具体建议。

此讲演将在Council For Optical Radiation Measurements年会上展示

发送电子邮件至 sales@vektrex.com 了解更多信息。

Jeff Hulett

Jeff Hulett is the Founder and CTO of Vektrex Electronic Systems, Inc. Because of his vision and leadership, the company grew from a start-up to the market leader. Currently, Hulett is the Chief Architect for Vektrex products placing the highest emphasis on technology and quality. Hulett holds a BSEE from the Illinois Institute of Electronics, and has been awarded four U.S.patents. He is a member of the Illumination Engineering Society of North America (IESNA), and chairs the IESNA LM-80 working group that is focused on LED flux maintenance testing. He has been active in the LED testing and reliability field since 2004.

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