短脉冲测试可消除自热误差,以生成真实的 L-I曲线

自从 LED 成为首选光源以来,准确确定其参数变得至关重要。测量 LED 光输出与电流关系的(L-I)曲线,就是这些参数之一(也是标准化测量)。不幸的是,曲线并不独立于其他参数。环境、封装类型和许多其他因素可能会扭曲结果。 Vektrex的CTO Jeff Hulett 和 欧司朗的Markus Schneider 博士撰写的一篇文章详细解释了可以通过短脉冲测试解决的这个问题。

访问 LED Professional LpR 83 Jan/Feb 2021

下载发表于 LED Professional LpR 83 Jan/Feb 2021 的 Vektrex 短脉冲测试文章

有关使用 SpikeSafe SMU 进行短脉冲测试的更多信息,请联系 Vektrex。

Jeff Hulett

Jeff Hulett is the Founder and CTO of Vektrex Electronic Systems, Inc. Because of his vision and leadership, the company grew from a start-up to the market leader. Currently, Hulett is the Chief Architect for Vektrex products placing the highest emphasis on technology and quality. Hulett holds a BSEE from the Illinois Institute of Electronics, and has been awarded four U.S.patents. He is a member of the Illumination Engineering Society of North America (IESNA), and chairs the IESNA LM-80 working group that is focused on LED flux maintenance testing. He has been active in the LED testing and reliability field since 2004.

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