Accurately characterizing micro-LEDs, VCSELs, and sub-threshold semiconductor device sweeps requires ultra-low noise floors and tight timing synchronization. Standard SMUs often introduce common-mode noise that obscures faint optical outputs, distorting critical turn-on characteristics. Our Pulsed SMU solutions deliver exceptional measurement sensitivity down to sub-microamp drive currents, allowing engineers to capture smooth, highly repeatable P-I (Power-Current) curves down into the sub-nanowatt range.
