Typical LED measurement systems use source/measure instruments delivering DC or pulsed current. In many of these systems junction temperature is uncontrolled, resulting in LED transient junction heating. This combined with timing variability can introduce flux measurement variability –especially at high power levels. This paper presents LM-85 research results conducted at Vektrex that traces the source and magnitude of these errors.
Jeff Hulett will be presenting at CORM May 15-18,2016.
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