MicReD T3Ster, conceived in 1977, is the first tester to provide real time measurements in conformance with the static test method described in the Jedec JESD51-1 standard. This “continuous measurement” technique combined with precision hardware results in capturing very accurate, noise-free, real thermal transient curves at high time resolution. At the time, T3Ster was considered THE TESTER.
Fast forward 45 years. Technology has advanced. Device heat paths have changed. A 12 bit measurement does not compete with an 18 bit measurement. Watt densities have increased. Electrical current requirements are higher. Software and hardware technology greatly simplifies performing measurements that were once very difficult. Measurements once only available in an expensive single purpose instrument are now available using Vektrex SpikeSafe SMU.
Vektrex offers the next generation tester based upon the industry standard Spikesafe Pulsed SMU. The SMU’s logarithmic digitizing capability makes it easy to measure component, circuit board, or luminaire thermal resistance using the JESD51-14 method. When log mode is selected, the digitizer continuously captures and boxcar averages samples, time-tagging and collecting the data in a compact log data file that that is used to create thermal transient plots and structure function. Using these plots, the thermal resistance is determined. To work with structure functions or to make JESD51-14 measurements, order the Vektrex SpikeSafe SMU with the bias option.