10 A Source Measure Unit

The 10 A Source Measure Unit incorporates continuous power conversion, which means no duty cycle or pulse width limitations. Output pulses have nanosecond rise and fall times – key to precise LED, VCSEL, and LIDAR photometric and electrical measurements. A precision hardware-controlled timing system synchronizes source, measure and external instrumentation. This 10 A SMU supplies precision DC, continuous pulse, and single pulse current with excellent pulse fidelity.


Key Features

  • Pulse width range: 10 μs (01 μs or 50 μs option) to 15000s
  • Max DC output power: 300W (600W option)
  • Max pulsed output power: 1350 W
  • Clean pulse shapes
  • Minimal distortion
  • High repeatability
Repeatable Measurements with Vektrex SMU
Blue data indicates LED flux measurement deviations caused by firmware-induced timing uncertainty. Actual trend line data produced by Vektrex source measure instrument in red.

Applications

Vektrex Precision Pulsed Current Source 10A 44.8V current pulse 100uS pulse width 863.2ns rise time

Pulse Scope Shot

The 10 A Source Measure Unit offers programmable pulse width flexibility. It is capable of long pulse widths (ms to seconds) and short pulse widths (1 μs pulse widths and above). Programmable load tuning alters the 10 A Source Measure Unit to compensate for load conditions, cable impedance and length. Pulse width accuracy is 1 μs with nanosecond pulse rise and fall times.

Example LIV sweep identifying LI and IV curves

LIV Curves

LIV curves provide a complete view of device performance by combining light output, current, and voltage into a single, time-aligned measurement. Using precision pulsed SMU technology, engineers can accurately characterize efficiency, threshold behavior, and overall device performance with minimal thermal distortion.

Spectral Response


A spectral response test using a Vektrex Source Measure Unit characterizes how a device responds electrically across different wavelengths of light, from ultraviolet through infrared. By precisely biasing the device and measuring its current or voltage response at each wavelength, the system generates a detailed spectral response curve that reveals sensitivity, peak performance, and cutoff regions. This capability is essential for evaluating photodiodes, image sensors, solar cells, and other optoelectronic devices where accurate light-to-electrical conversion performance is critical.


10 A Source Measure Unit Specifications

10 A Source Measure Unit Specifications10 A (Max Current)
Overall
Min Output Voltage0 V
Max Compliance Voltage50 V, 100 V, 200 V, 400 V
Source Channels1
Max DC Output Power300 W (600 W option)
Max Pulsed Out Power1350 W
10 A Source Measure Unit Specifications10 A (Max Current)
Pulsing
Pulse Width Range10 μs (01 μs or 50 μs option) to 15000s
Pulse Width Resolution0.1μs (11 ns w/ Pulse Width Offset)
Pulse Width Accuracy1μs (50 ns w/ Pulse Width Offset)
Pulse Rise/Fall Time200 ns – 3 μs
Typical Pulse Width Jitter30 ns
Timebase Accuracy50 ppm
Pulse Period Range11μs – 30000 s, depending on model
Duty Cycle RangeProgrammable 0-100%, no current limits, limited by Toffmin of 20 μs or 9 μs (1μs model)
Pulse Count0 – 12000000 (Multiple Pulse and Pulsed Sweep modes)
Sweep Steps3 – 10000 (Pulsed Sweep mode)
Low Range Current
Max Current400 mA
Setpoint Resolution10 μA
Output Current Accuracy0.04%+1 mA
Min Recommended Current1 mA
High Range Current
Max Current10 A
Setpoint Resolution200 μA
Output Current Accuracy0.08% + 5 mA

Digitizer Specifications

Digitizer Channels1,2
Measure Method4 wire
Ranges3 Ranges, 10 V, 100 V and 400 V
Input Impedance1 MΩ -1.4 MΩ
Disconnect RelayDisconnect Sense +/- terminals when Digitizer is placed in 0 V range
CouplingDC Coupled, All Ranges
Maximum Common ModeSense+ or Sense- must be <420 VDC from Chassis Ground or Force+ or Force-
ADC Sample Rate500,000 samples/second, continuous sampling
Digitizer TypeTrue differential
Resolution18 Bits
Programmable Measurement Aperture2 μs to 400 ms, 500 kHz samples boxcar averaged to form measurement points
Measurement TriggerSoftware or hardware
Hardware Trigger Edge PolarityProgrammable
Trigger DelayProgrammable 0 to 400 ms, 2 μs resolution
Measurement Points Per Acquisition1 to 525
Autozero FunctionReduces measurement offset
Sampling MethodLogarithmic sampling to 1000 s, and custom programmable sampling available with +BIAS option

Digitizer Range Specifications

Ranges10 V100 V400 V
Maximum Voltage10.4 V112.2 V420.6 V
Typical Noise, RMS100 μV200 μV500 μV
Bandwidth (-3dB)570 kHz290 kHz570 kHz
Accuracy0.03% + 300 μV0.09% + 3 mV0.06% + 30 mV

General SpikeSafe SMU Specifications

Current Out
Digitizer Channels1,2
Output Current Drive TypeFloating, both + and – terminal driven, max 100 V common mode to chassis ground
Output CablingSingle or multi-conductor twisted pair
Recommended Max Output Cable Length6 m
Trigger In
Signal Type5 V logic, VIH > 3.5 V, VIL < 1.5 V
PolarityProgrammable
Modes SupportedMultiple Pulse, Pulsed Sweep, Modulated Current
Programmable DelayProgrammable delay, 10 μs to 30 s
Delay Programming Resolution1 μs
Delay JitterMultiple Pulse Mode: 3.4 μs, Pulsed Sweep Mode: 107 μs
Trigger Out
Signal Type5 V logic, 50 Ω pull-up and open drain outputs
PolarityProgrammable
Modes SupportedAll pulsed modes, Software trigger in DC mode
Trigger Jitter<10 ns typical
Programmable DelayProgrammable delay, 10 μs to 30 s
Miscellaneous
Nominal Current Ripple<1A: 0.03%+300 µA >1A:
0.012%+1mA
DC Ramp Rate: Low Speed Setting10 V/s, 50 mA/s
DC Ramp Rate: Default Setting10 V/s, 500 mA/s
DC Ramp Rate: High Speed Setting1000 V/s, 50 A/s
Current Stability70 ppm
SpikeSafe Transient ProtectionPower shutdown timing ns. (voltage monitor accuracy: 3% +1 V | current monitor accuracy: model dependent)
Other External Factors
General Purpose Input (EXT_GPI)Optoisolated input, generates External Pause SYST:ERR? Event, VLow Max: 0.75 V, VHigh Min: 2.72 V, VHigh Max: 27.2 V
Remote Disable (Interlock)Optoisolated input, halts output, selectable polarity, VLow Max: 0.75 V, VHigh Min: 2.72 V, VHigh Max: 27.2 V
General
PhysicalRack mount/bench top chassis
1/2 Rack 89 mmH x 213 mmW x 452 mmD
Weight: 8 lbs, 3.6 kg
Input PowerAC 100-240 VAC, 700 W, Single Phase
Remote Control100-base T Ethernet, TCP/IP with SCPI syntax
Monitoring SystemBuilt-in acquisition system monitors & reports voltage, current, and fault conditions
Device Protection3rd generation SpikeSafe protection including high-speed over current shutdown, slow start up, leakage detection and other protection algorithms
Calibration Interval1 year calibration interval recommended
Operating ConditionsFor indoor use only, 10 C to 35 C, <2000 m altitude
CoolingAir cooled
Particulate LevelClean lab conditions
OtherCE, ROHS, ISO17025 certification

Add-Ons


Operating Modes

Operating ModeDescriptionTypical Application
BiasConstant DC bias current – generally used for SVF (voltage sensitivity factor) determination.Thermal Resistance and Tj measurements. Bias may be added to many operating modes. Requires purchase of optional BIAS.
Continuous DynamicContinuous pulse train – current changes may occur while the source channel is enabled.PWM, production binning, closed-loop power control.
Continuous PulseContinuous current pulse train that transitions on and off according to configured pulse parameters.Continuous pulse light measurements to reduce junction heating. Any other continuous pulse application.
CW SweepConstant wave current sweep.Typical characterization test where output parameters like power are monitored over a range of input power levels.
DCDirect current. Also known as constant current or constant wave. DC dynamic mode allows current to be changed +/- during DC operation.Any constant current application. LM-85, light measurement, characterization, R&D, production.
DC DynamicConstant current – current changes may occur while the source channel is enabled.Low speed > 10s pulsing. Software controlled pulsing. Useful for TEC control.
Modulated CurrentA programmable sequence of DC current steps that define a waveform. Sequences may be finite or run indefinitely.Cell phone flash emulation, rectifier ripple emulation. Requires purchase of optional Modulated Current function.
Multiple PulseSimilar to Single Pulse mode, but allows a programmable number of pulses to be output.Fixed pulse count device testing. Also recommended for Single Pulse use (1 pulse).
Multiple Pulse BurstMultiple bursts of pulses with defined pulse and burst timing, and current changes.Burst L-I-V sweeps, high duty cycle sweeps.
Pulsed SweepAlso known as QCW (quasi-constant wave). Primarily used to minimize self-heating such as with I-V, L-I, and LIV curves. Pulsed sweep on/off may be used to thermally stress
devices or speed lifetime test. Also used for withstand or limit testing. Step number reported at error used to identify failure current.
I-V plots for LEDs, lasers, and other semiconductors. L-I plots for optoelectronics, overcurrent protection circuit tests, pulse withstand testing.
Repetitive Burst ModeMultiple bursts of bursts.VCSEL testing. Customer specific applications.
Single PulseAlso known as mono pulse. One pulse output (one transition on and off) according to configured pulse parameters.Any single pulse application. LM-85, light measurement, characterization, R&D, production.

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Accurate currents combined with fast rise and fall times plus a precision hardware-controlled timing system that synchronizes source, measure and external instrumentation allow for discovery at low currents.


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