50 mA Source Measure Unit

The 50 mA Source Measure Unit is a highly specialized and precise instrument tailored for testing and characterizing low current semiconductor devices including light emitting devices, such as VCSEL singlets, single emitters, microLED. The ability to provide both DC current and precision pulsed current with excellent pulse fidelity at low currents is crucial for accurately assessing the performance and characteristics of these devices.


Key Features

  • Pulse width range: 10 μs minimum to 15000 s
  • Max DC output power: 5 W
  • Max pulsed output power: 5 W
  • Clean pulse shapes
  • Minimal distortion
  • High repeatability
Repeatable Measurements with Vektrex SMU
Blue data indicates LED flux measurement deviations caused by firmware-induced timing uncertainty. Actual trend line data produced by Vektrex source measure instrument in red.

Applications

Vektrex 50mA SMU LED load 10mA 50V 50us pulse

Pulse Scope Shot

Pulse scope shots demonstrate the stability and accuracy of delivered current under demanding conditions. You can rely on these waveforms to verify that every pulse remains free of distortion, overshoot, or unwanted noise, ensuring repeatable and trustworthy test results.

Example LIV sweep identifying LI and IV curves

LIV Curves

LIV curves provide a complete view of device performance by combining light output, current, and voltage into a single, time-aligned measurement. Using precision pulsed SMU technology, engineers can accurately characterize efficiency, threshold behavior, and overall device performance with minimal thermal distortion.

Spectral Response


A spectral response test using a Vektrex Source Measure Unit characterizes how a device responds electrically across different wavelengths of light, from ultraviolet through infrared. By precisely biasing the device and measuring its current or voltage response at each wavelength, the system generates a detailed spectral response curve that reveals sensitivity, peak performance, and cutoff regions. This capability is essential for evaluating photodiodes, image sensors, solar cells, and other optoelectronic devices where accurate light-to-electrical conversion performance is critical.


50 mA Source Measure Unit Specifications

50 mA Source Measure Unit Specifications50 mA (Max Current)
Overall
Min Output Voltage0 V
Max Compliance Voltage50 V, 100 V, 200 V, 400 V
Source Channels1
Max DC Output Power5 W
Max Pulsed Out Power5 W
50 mA Source Measure Unit Specifications50 mA (Max Current)
Pulsing
Pulse Width Range10 μs minimum to 15000 s
Pulse Width Resolution0.1μs (11 ns w/ Pulse Width Offset)
Pulse Width Accuracy1μs (50 ns w/ Pulse Width Offset)
Pulse Rise/Fall Time200 ns – 3 μs
Typical Pulse Width Jitter30 ns
Timebase Accuracy50 ppm
Pulse Period Range11μs – 30000 s, depending on model
Duty Cycle RangeProgrammable 0-100%, no current limits, limited by Toffmin of 20 μs or 9 μs (1μs model)
Pulse Count0 – 12000000 (Multiple Pulse and Pulsed Sweep modes)
Sweep Steps3 – 10000 (Pulsed Sweep mode)
Low Range Current
Max Current4 mA
Setpoint Resolution100 nA
Output Current Accuracy0.05% + 6 μA
Min Recommended Current6 μA
High Range Current
Max Current50 mA
Setpoint Resolution1 μA
Output Current Accuracy0.05% + 10 μA

Digitizer Specifications

Digitizer Channels1,2
Measure Method4 wire
Ranges3 Ranges, 10 V, 100 V and 400 V
Input Impedance1 MΩ -1.4 MΩ
Disconnect RelayDisconnect Sense +/- terminals when Digitizer is placed in 0 V range
CouplingDC Coupled, All Ranges
Maximum Common ModeSense+ or Sense- must be <420 VDC from Chassis Ground or Force+ or Force-
ADC Sample Rate500,000 samples/second, continuous sampling
Digitizer TypeTrue differential
Resolution18 Bits
Programmable Measurement Aperture2 μs to 400 ms, 500 kHz samples boxcar averaged to form measurement points
Measurement TriggerSoftware or hardware
Hardware Trigger Edge PolarityProgrammable
Trigger DelayProgrammable 0 to 400 ms, 2 μs resolution
Measurement Points Per Acquisition1 to 525
Autozero FunctionReduces measurement offset
Sampling MethodLogarithmic sampling to 1000 s, and custom programmable sampling available with +BIAS option

Digitizer Range Specifications

Ranges10 V100 V400 V
Maximum Voltage10.4 V112.2 V420.6 V
Typical Noise, RMS100 μV200 μV500 μV
Bandwidth (-3dB)570 kHz290 kHz570 kHz
Accuracy0.03% + 300 μV0.09% + 3 mV0.06% + 30 mV

General SpikeSafe SMU Specifications

Current Out
Digitizer Channels1,2
Output Current Drive TypeFloating, both + and – terminal driven, max 100 V common mode to chassis ground
Output CablingSingle or multi-conductor twisted pair
Recommended Max Output Cable Length6 m
Trigger In
Signal Type5 V logic, VIH > 3.5 V, VIL < 1.5 V
PolarityProgrammable
Modes SupportedMultiple Pulse, Pulsed Sweep, Modulated Current
Programmable DelayProgrammable delay, 10 μs to 30 s
Delay Programming Resolution1 μs
Delay JitterMultiple Pulse Mode: 3.4 μs, Pulsed Sweep Mode: 107 μs
Trigger Out
Signal Type5 V logic, 50 Ω pull-up and open drain outputs
PolarityProgrammable
Modes SupportedAll pulsed modes, Software trigger in DC mode
Trigger Jitter<10 ns typical
Programmable DelayProgrammable delay, 10 μs to 30 s
Miscellaneous
Nominal Current Ripple<1mA: 4 μA
1 mA to 10 mA: 40 μA
10 mA to 50 mA: 17 0μA
DC Ramp Rate: Low Speed Setting10 V/s, 50 mA/s
DC Ramp Rate: Default Setting10 V/s, 500 mA/s
DC Ramp Rate: High Speed Setting1000 V/s, 50 A/s
Current Stability70 ppm
SpikeSafe Transient ProtectionPower shutdown timing ns. (voltage monitor accuracy: 3% +1 V | current monitor accuracy: model dependent)
Other External Factors
General Purpose Input (EXT_GPI)Optoisolated input, generates External Pause SYST:ERR? Event, VLow Max: 0.75 V, VHigh Min: 2.72 V, VHigh Max: 27.2 V
Remote Disable (Interlock)Optoisolated input, halts output, selectable polarity, VLow Max: 0.75 V, VHigh Min: 2.72 V, VHigh Max: 27.2 V
General
PhysicalRack mount/bench top chassis
1/2 Rack 89 mmH x 213 mmW x 452 mmD
Weight: 8 lbs, 3.6 kg
Input PowerAC 100-240 VAC, 700 W, Single Phase
Remote Control100-base T Ethernet, TCP/IP with SCPI syntax
Monitoring SystemBuilt-in acquisition system monitors & reports voltage, current, and fault conditions
Device Protection3rd generation SpikeSafe protection including high-speed over current shutdown, slow start up, leakage detection and other
protection algorithms
Calibration Interval1 year calibration interval recommended
Operating ConditionsFor indoor use only, 10 C to 35 C, <2000 m altitude
CoolingAir cooled
Particulate LevelClean lab conditions
OtherCE, ROHS, ISO17025 certification

Configuration Options

Force Sense Selector Switch

  • Connect/disconnect function
  • A/B switch function
  • Integrated guarded switch

Modulated Current

  • Describe complex waveforms in a text based format for download into the SMU and execution or infinite looping.
Graph of IEC 62717 temperature cycling test.

Diagram describing the different areas of an LED undertest, highlighting the junction temperature are the very top.

Bias Current

  • Designed for thermal measurements
  • Enables continuous low-level sourcing
  • In-situ Junction Temperature
  • JEDEC Dual Interface Test Method
  • Find device failures during production

Operating Modes

Operating ModeDescriptionTypical Application
BiasConstant DC bias current – generally used for SVF (voltage sensitivity factor) determination.Thermal Resistance and Tj measurements. Bias may be added to many operating modes.
Requires purchase of optional BIAS.
Continuous DynamicContinuous pulse train – current changes may occur while the source channel is enabled.PWM, production binning, closed-loop power control.
Continuous PulseContinuous current pulse train that transitions on and off according to configured pulse parameters.Continuous pulse light measurements to reduce junction heating. Any other continuous
pulse application.
CW SweepConstant wave current sweep.Typical characterization test where output parameters like power are monitored over a
range of input power levels.
DCDirect current. Also known as constant current or constant wave. DC dynamic mode allows current to be changed +/- during DC operation.Any constant current application. LM-85, light measurement, characterization, R&D,
production.
DC DynamicConstant current – current changes may occur while the source channel is enabled.Low speed > 10s pulsing. Software controlled pulsing. Useful for TEC control.
Modulated CurrentA programmable sequence of DC current steps that define a waveform. Sequences may be finite or run indefinitely.Cell phone flash emulation, rectifier ripple emulation. Requires purchase of optional
Modulated Current function.
Multiple PulseSimilar to Single Pulse mode, but allows a programmable number of pulses to be output.Fixed pulse count device testing. Also recommended for Single Pulse use (1 pulse).
Multiple Pulse BurstMultiple bursts of pulses with defined pulse and burst timing, and current changes.Burst L-I-V sweeps, high duty cycle sweeps.
Pulsed SweepAlso known as QCW (quasi-constant wave). Primarily used to minimize self-heating such as with I-V, L-I, and LIV curves. Pulsed sweep on/off may be used to thermally stress
devices or speed lifetime test. Also used for withstand or limit testing. Step number reported at error used to identify failure current.
I-V plots for LEDs, lasers, and other semiconductors. L-I plots for optoelectronics,
overcurrent protection circuit tests, pulse withstand testing.
Repetitive Burst ModeMultiple bursts of bursts.VCSEL testing. Customer specific applications.
Single PulseAlso known as mono pulse. One pulse output (one transition on and off) according to configured pulse parameters.Any single pulse application. LM-85, light measurement, characterization, R&D, production.

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Accurate currents combined with fast rise and fall times plus a precision hardware-controlled timing system that synchronizes source, measure and external instrumentation allow for discovery at low currents.


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