Junction Temperature Assessment for LEDs & Lasers Operated in Pulsed Mode Presentation at CORM 2022
Monday November 14, 2022 Vektrex CTO Jeff Hulett chairs the CORM “LED applications and Metrology” session. The session details are…
Current Sources
Log Scaling Now Available With Spikesafe SMU
Easily Generate Structure Functions and Determine Thermal Resistance Capabilities previously only available in an expensive, single-purpose instrument are now available…
LM-80-21 Release Improves Testing Methodology
LM-80-21 improves testing methodology for visible LED devices and addresses applicability to new classes of devices, including UV LEDs, laser…
Use SpikeSafe 400 Pulsed Source to Power and Test LED modules to 400V
The SpikeSafe 400 pulsed source is ideal for powering and testing LED modules with series circuits up to 400V. Test…
Use Vektrex Fast Pulsed SMU to Beat the Heat
Vektrex SMU used to evaluate effectiveness of industry test methods. Device junction heating distorts measurements, causing L-I curves to droop…
Instrument Systems Announces Short Pulse Testing Capability
Reliable short-pulse measurements require pulsed current sources with fast rise and fall times in conjunction with spectroradiometers having measuring times…
Current Source Induced LED Photometric Measurement Variations Presentation at CORM
Jeff Hulett, Vektrex CTO, discussed Current Source Induced LED Photometric Measurement Variations at CORM...
UV LED Thyristor Effect
The SpikeSafe SMU was used to resolve a question regarding UV LED testing that was vexing the IES working group:…