New Optical Metrology and Documentary Standards for GUV Radiation Sources
By C. Cameron Miller, NIST, Yuqin Zong, NIST, and Jeff Hulett, Vektrex Vektrex CTO Jeff Hulett and NIST scientists Cameron…
Jeff Hulett
Jeff Hulett is the Founder and CTO of Vektrex Electronic Systems, Inc. Because of his vision and leadership, the company grew from a start-up to the market leader. Currently, Hulett is the Chief Architect for Vektrex products placing the highest emphasis on technology and quality. Hulett holds a BSEE from the Illinois Institute of Electronics, and has been awarded four U.S.patents. He is a member of the Illumination Engineering Society of North America (IESNA), and chairs the IESNA LM-80 working group that is focused on LED flux maintenance testing. He has been active in the LED testing and reliability field since 2004.
NIST, IUVA, and Vektrex Collaboration Produces LM-92 UV LED Testing Standard
Jeff Hulett, Cameron Miller, and Troy Cowan detail the importance of cross-organization participation in UV standards development and how those…
Simplify Short Pulse Test Implementation
Published in LEDs Magazine, Jeff Hulett explains how a new short-pulse test method has advanced spectrometer and source/measure instrument capabilities…
LM-85 Light Measurements for High Power LEDs
LM-85 is an Illuminating Engineering Society (IES) approved method for the Electrical and Photometric Measurements of High Power LEDs. The…
Short Pulses For Better Measurements
LED electrical and optical parameters are traditionally measured using test current pulses that last 20ms. Until recently, this approach has…
Log Scaling Now Available With Spikesafe SMU
Easily Generate Structure Functions and Determine Thermal Resistance Capabilities previously only available in an expensive, single-purpose instrument are now available…
Accurate Optical Measurements of Light Emitting Diodes and Laser Diodes
Accurate Optical Measurements of Light Emitting Diodes and Laser Diodes using the powerful Differential Continuous Pulse measurement method. The powerful…
LM-80-21 Release Improves Testing Methodology
LM-80-21 improves testing methodology for visible LED devices and addresses applicability to new classes of devices, including UV LEDs, laser…
“Factors to Consider with UV LED Measurements” LEDs Magazine Webinar November 18, 2021
UV and UV-C LEDs exhibit a transient voltage effect that increases Vf during the first few milliseconds of operation. While…